Normal view MARC view ISBD view

Physical Principles of Electron Microscopy

Egerton Ray F

Physical Principles of Electron Microscopy - New York Springer 2005 - 202

ISBN: 9780387258003

Subjects--Topical Terms:
AEM
electron
microscopy
SEM
TEM
physical

Dewey Class. No.: 502 EGE

Place hold
Print
Cite
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)