Egerton Ray F <br/><br/>
Physical Principles of Electron Microscopy 

 - New York  Springer  2005 
 - 202 
<br/><br/><label>ISBN: </label>9780387258003 
<br/><br/><label>Subjects--Topical Terms: </label><br/> AEM<br/> electron<br/> microscopy<br/> SEM<br/> TEM<br/>physical
<br/><br/><label>Dewey Class. No.: </label>502 EGE